This new device can measure the ATP (Absolute Thermoelectric Power) of conductor and semiconductor materials. It enforces electronic transport as a non-destructive characterization and control tool.
The process is simple and can be applied to every conductor and semiconductor along a large temperature range. A light and portative device is fixed on the objet being tested. By creating a temperature difference at its surface, the constituting material ATP can be measured. The measurement device is made of two probes that are put in electrical contact with the analyzed material surface.
Patent delivered: FR 1257261